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TEM for Atomic-Scale Study: Fundamental, Instrumentation, and Applications in Nanotechnology

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Handbook of Materials Characterization

Abstract

Today, the transmission electron microscope (TEM) has become the foremost instrument for the microstructural characterization of nanomaterials. Indeed, the diffraction patterns performed by X-ray techniques are more quantitative than electron diffraction pattern, but electrons have a significant advantage over X-rays – electrons can be focused easily. In this chapter, we will begin by introducing some of the historical developments followed by instrumentations, sample preparation, and working and imaging modes of the TEM. The aim of this chapter to firsthand information about different functions of TEM and possible characterizations that can be performed by using TEM.

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Notes

  1. 1.

    Manufacturer of instruments and softwares for TEM.

  2. 2.

    TEM manufacturing company.

  3. 3.

    TEM manufacturing company.

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  1. Department of Physics, University of Agriculture, Faisalabad, Pakistan

    Yasir Javed, Khuram Ali, Kanwal Akhtar,  Jawaria, M. Irfan Hussain, Gulzar Ahmad & Taskeen Arif

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    Surender Kumar Sharma

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Javed, Y. et al. (2018). TEM for Atomic-Scale Study: Fundamental, Instrumentation, and Applications in Nanotechnology. In: Sharma, S. (eds) Handbook of Materials Characterization. Springer, Cham. https://doi.org/10.1007/978-3-319-92955-2_5

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